The United States Patent and Trademark Office (USPTO) has issued a memorandum reinforcing its current framework for assessing subject matter eligibility under 35 U.S.C. § 101, with specific attention to software-related technologies, including Artificial Intelligence (AI) and Machine Learning (ML). While the memorandum does not introduce new law or policy, it provides useful clarification on how examiners should apply existing guidance when evaluating claims involving judicial exceptions such as abstract ideas. This client alert highlights key takeaways relevant to innovators and patent applicants operating in software, AI, and related technical fields.
Key Reminders for Applicants in the Software and AI Space:
Caution on Close Calls: A Rejection Must Be Justified – Importantly, the memorandum reiterates that a rejection under § 101 should only be issued when it is more likely than not (greater than 50% certainty) that the claim is ineligible. If eligibility is a “close call,” the examiner is instructed not to reject. This reflects a practical, evidence-based approach to prosecution. Moreover, even where a § 101 rejection is not made, examiners are expected to evaluate claims fully under §§ 102, 103, and 112, in keeping with compact prosecution principles.
What This Means for Patent Applicants: This guidance signals continued scrutiny of software and AI-related claims but offers a clearer path to patent eligibility for those inventions that solve real technical problems in specific ways. Applicants should consider the following steps to strengthen the eligibility posture of their claims: draft claims that focus on concrete technical solutions rather than high-level concepts or results; include detailed descriptions in the specification that identify the technical problem and the corresponding improvement; avoid language that merely describes automation or generic computer usage unless tied to a specific technical effect; and emphasize how the invention improves the functioning of a computer or advances a technical field.
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